MPGA products based on a prototype FPGA

ABSTRACT

A smaller mask programmable gate array (MPGA) device derived from a larger field programmable gate array (FPGA), comprising: a layout of transistors and a plurality of interconnect layers substantially identical to a smaller region of the FPGA; and input/output pads matching a subset of the input/output pads of the FPGA; wherein, a design that is mapped to said smaller region of the FPGA device using said subset of input/output pads by a user programmable means can be identically mapped to the MPGA by a hard-wire circuit. Such a gate array further comprises a mask programmable metal-circuit in lieu of a user programmable configuration circuit of the FPGA; and a logic block to input/output pad connection in lieu of a logic block to a register at the boundary of said smaller region to an input/output pad connection of the FPGA.

This application is a continuation-in-part of application Ser. No.11/645,313 filed Dec. 26, 2006, now U.S. Pat. No. 7,627,848, which is acontinuation of application Ser. No. 11/384,116 filed on Mar. 20, 2006,now U.S. Pat. No. 7,356,799, which is a continuation of application Ser.No. 10/825,194 (now U.S. Pat. No. 6,992,503) filed on Apr. 16, 2004,which is a continuation of application Ser. No. 10/267,511 (now U.S.Pat. No. 6,747,478) filed Oct. 8, 2002, which claims priority fromProvisional App. Ser. No. 60/393,763 filed on Jul. 8, 2002 and App. Ser.No. 60/397,070 filed on Jul. 22, 2002, all of which have as inventor Mr.R. U. Madurawe and the contents of which are incorporated-by-reference.

This application is related to application Ser. No. 10/267,483 andapplication Ser. No. 10/267,484 (now abandoned), all of which were filedon Oct. 8, 2002 and list as inventor Mr. R. U. Madurawe, the contents ofwhich are incorporated-by-reference. This application is also related toapplication Ser. No. 10/691,013 (now U.S. Pat. No. 7,129,744) filed onOct. 23, 2003, application Ser. No. 10/846,698 (now U.S. Pat. No.7,064,018) filed on May 17, 2004, application Ser. No. 10/846,699 (nowU.S. Pat. No. 7,112,994) filed on May 17, 2004, application Ser. No.10/864,092 filed on Jun. 8, 2004, application Ser. No. 10/937,828 filedon Sep. 10, 2004, and application Ser. No. 11/102,855 filed on Apr. 11,2005, all of which list as inventor Mr. R. U. Madurawe, and the contentsof which are incorporated-by-reference.

BACKGROUND

The present invention relates to multi-dimensional integrated circuits.More specifically it relates to design conversion from a fieldprogrammable device (FPGA) to different density metal programmableapplication specific devices (MPGA) to reduce cost and improveperformance, power and reliability.

Traditionally, integrated circuit (IC) devices such as custom,semi-custom, or application specific integrated circuit (ASIC) deviceshave been used in electronic products to reduce cost, enhanceperformance or meet space constraints. However, the design andfabrication of custom or semi-custom ICs can be time consuming andexpensive. The customization involves a lengthy design cycle during theproduct definition phase and high Non Recurring Engineering (NRE) costsduring manufacturing phase. When device geometries shrink, signal timingin an ASIC is wire-delay dominant. Wire delays are non-predictableduring synthesis & placement phase, and comprise “RC” extractions ofpost-placement result of the best guess placement. Thus timing closurebecomes a significant bottle neck in ASIC designs. Further, shoulderrors exist in the custom or semi-custom ICs, the design/fabricationcycle has to be repeated, further aggravating the time to market andengineering cost. As a result, ASICs serve only specific applicationsand are custom built for high volume and low cost applications.

Another type of semi custom devices called Gate Array, Structured Array,Structured ASIC or Metal Programmable Gate Arrays (MPGA), henceforth alltermed MPGAs, customizes modular blocks at a reduced NRE cost bysynthesizing the design using a software model similar to the ASIC. Thelogic arrays are pre-fabricated; while only one or more metal layers arecustomize to fit the design with lower utilization over ASICs. Themissing apriori wire-delays make the MPGA timing closure as difficult asin the ASIC. The missing silicon level design verification results inmultiple spins and lengthy design iterations.

In recent years there has been a move away from custom or semi-customICs towards field programmable components whose function is determinednot when the integrated circuit is fabricated, but by an end user “inthe field” prior to use. Off the shelf, generic Programmable LogicDevice (PLD) or Field Programmable Gate Array (FPGA) products,henceforth all termed FPGAs, greatly simplify the design cycle. Theseproducts offer user-friendly software to fit custom logic into thedevice through programmability, and the capability to tweak and optimizedesigns to optimize silicon performance. All wire delays arepre-characterized and FPGAs offer easy timing closure in a predictablemanner thus solving ASIC and MPGA biggest problem. The flexibility ofthis programmability is expensive in terms of silicon real estate, butreduces design cycle and upfront NRE cost to the designer.

FPGAs offer the advantages of low non-recurring engineering costs, fastturnaround (designs can be placed and routed on an FPGA in typically afew minutes to a few hours), and low risk since designs can be easilyamended late on in the product design cycle. It is only for high volumeproduction runs that there is a cost benefit in using the moretraditional approaches. However, the conversion from an FPGAimplementation to an MPGA or ASIC implementation typically requires acomplete redesign. Such redesign is undesirable in that the FPGA designeffort is wasted.

Compared to an FPGA, an ASIC or MPGA has hard-wired logic connections,identified during the chip design phase, and need no configurationmemory cells. They further require much less wires to connect logic.This is a large chip area and cost saving for the ASIC. Smaller ASIC diesizes lead to better performance. A full custom ASIC also has customizedlogic functions which take less gate counts compared to PLD and FPGAconfigurations of the same functions. Thus, an ASIC is significantlysmaller, faster, cheaper and more reliable than an equivalent gate-countFPGA. The trade-off is between time-to-market (PLD and FPGA advantage)versus low cost and better reliability (ASIC pr MPGA advantage).

There is no convenient timing exact migration path from an FPGA used asa design verification and prototyping vehicle to the lower die size(hence lower cost) ASIC or MPGA. All of the SRAM or Anti-fuseconfiguration bits and programming circuitry that makes the FPGA moreexpensive has no value to the ASIC or MPGA. Programmable module removalfrom the FPGA and the ensuing layout and design customization is timeconsuming with severe timing variations from the original design.Input/output pad position changes also impact signal timing.

There is no convenient timing improvement or power reduction path froman FPGA used as a design verification and prototyping vehicle to thelower die size ASIC or MPGA. All of the SRAM or Anti-fuse configurationbits and programming circuitry that makes wire delays slow and powerconsumption high has no value to the ASIC or MPGA. Programmable moduleremoval from the FPGA and the ensuing layout and design customization istime consuming with severe non-predictable timing variations from theoriginal design.

There is no convenient single prototype FPGA that can be used as adesign verification and prototyping vehicle, and provide an easybit-stream compatible design conversion to a lower cost, or betterperformance, or lower power, or smaller density ASIC or MPGA. All of theconfiguration and programming overhead & pre-connected parasiticoverhead within the FPGA has no value to the ASIC or MPGA. Parasiticoverhead removal from the FPGA and the ensuing layout and designcustomization is time consuming with severe non-predictable timingvariations from the original design.

What is therefore needed is a single prototype FPGA that can be used asdesign verification and prototyping vehicle, and further provide easybit-stream compatible design conversion to more user desirable one ormore MPGA products comprising varying densities for production.

SUMMARY

In one aspect, a three-dimensional semiconductor device with twoselectable manufacturing configurations includes a first module layerhaving a plurality of circuit blocks; and a second module layer formedsubstantially above the first module layer, wherein in a firstselectable configuration a plurality of memory circuits are formed tostore instructions to control a portion of the circuit blocks, andwherein in a second selectable configuration a predetermined conductivepattern is formed in lieu of the memory circuit to control substantiallythe same portion of the circuit blocks.

Implementations of the above aspect may include one or more of thefollowing. A third module layer can be formed substantially above thefirst module layer, wherein interconnect and routing signals are formedto connect the circuit modules within the first and second modulelayers. The second module layer in its first configuration can containisolated through connections to connect the first module layer to thethird module layer. A third module layer can be formed between the firstand second module layers, wherein interconnect and routing signals areformed to connect the circuit modules within the first and second modulelayers. The first selectable configuration forms a programmable logicdevice (PLD) with one or more digital circuits formed on the firstmodule layer; one or more programmable logic blocks formed on the firstmodule layer and electrically coupled to the digital circuits; one ormore memory blocks formed on the first module layer and electricallycoupled to the digital circuits; one or more configurable memoryelements formed on the second module layer and electrically coupled tothe programmable logic blocks to customize the programmable content ofthe PLD; and one or more interconnect and routing signals formed in athird module layer, electrically coupled to first and second modulelayers to provide the functionality of the PLD. The second selectableconfiguration forms an Application Specific Integrated Circuit (ASIC)with one or more digital circuits formed on the first module layer; oneor more programmable logic blocks formed on the first module layer andelectrically coupled to the digital circuits; one or more memory blocksformed on the first module layer and electrically coupled to digitalcircuits; one or more predetermined connections formed on the secondmodule layer and electrically coupled to the programmable logic blocksto customize the programmable content; and one or more interconnect androuting signals formed in a third module layer and electrically coupledto first and second module layers. The second module layer can begeneric and user configurable to program and re-program to alter thefunctional response and performance of the PLD. The predeterminedconductive pattern can be positioned substantially above the digitalcircuits. The predetermined conductive pattern can also be integrated inthe first module layer or alternatively can be integrated in the thirdmodule layer. For every given memory pattern of the second module layerin the first configuration, a unique predetermined connection patternexists in the second configuration to substantially match logiccustomization. One or more of the circuit blocks within the first modulelayer can maintain substantially identical timing characteristics underboth configurations of second module layer logic control. The memorycircuit can include one or more thin film devices such as thin filmtransistors (TFTs), resistors and capacitors. The replaceable memory canbe selected from the group consisting of fuse links, antifusecapacitors, SRAM cells, DRAM cells, metal optional links, EPROM cells,EEPROM cells, Flash cells, and Ferro-electric elements. The digitalcircuit can include a third-party IP core. The digital circuit includesa processor capable of executing software logic instructions and otherprogrammable logic blocks, wherein the programmable logic block isselected from one or more of a pass gate logic, multiplexer logic, truthtable logic, or an AND/OR logic. The module layer one can include asubstrate layer, n-well & p-well layers, field isolation regions, NMOS &PMOS gate, drain, source regions of transistors built on substrate, N+ &P+ diodes, resistors and capacitors built on substrate, gate oxide, gatepoly, salicided regions, inter layer dielectric and contacts.

In another aspect, a programmable logic device includes one or moredigital circuits formed on a substrate; and a non-planar circuitelectrically coupled to the digital circuits, the non-planar circuitbeing either a memory constructed to store data to define the logicoutputs of the digital circuits to fabricate a field programmable gatearray (FPGA) or a conductive pattern constructed to define the logicoutputs of the digital circuits to fabricate an application specificintegrated circuit (ASIC), wherein the memory and the conductive patternoptions have substantially matching functionality timingcharacteristics.

Implementations of the above aspects may include one or more of thefollowing. The IC product is re-programmable in its initial stage withturnkey conversion to an ASIC. The IC has the end ASIC cost structureand FPGA re-programmability. The IC product offering occurs in twophases: the first stage is a generic FPGA that has re-programmabilitycontaining a programmable module, and the second stage is a timing-exactASIC with the entire programmable module replaced by 1 to 2 customizedhard-wire masks.

In another aspect, a programmable logic device includes a plurality ofprogrammable logic cells built on a semiconductor substrate layer; and aplurality of interconnect wires constructed above said of programmablelogic cells; and either configuration memory circuits or metal-wiresconstructed above said of programmable logic cells to program the logicfunctions and interconnect wire pattern; wherein a single larger FPGAcan be used non-planar circuit being either a memory constructed tostore data to define the logic outputs of the digital circuits tofabricate a field programmable gate array (FPGA) or a conductive patternconstructed to define the logic outputs of the digital circuits tofabricate an application specific integrated circuit (ASIC), wherein thememory and the conductive pattern options have substantially matchingfunctionality and timing characteristics.

Implementations of the above aspects may include one or more of thefollowing. The IC product is re-programmable in its initial stage withturnkey conversion to an ASIC. The IC has the end ASIC cost structureand FPGA re-programmability. The IC product offering occurs in twophases: the first stage is a generic FPGA that has re-programmabilitycontaining a programmable module, and the second stage is a timing-exactASIC with the entire programmable module replaced by 1 to 2 customizedhard-wire masks.

In another aspect, a smaller mask programmable gate array (MPGA) devicederived from a larger field programmable gate array (FPGA), comprising:a layout of transistors and a plurality of interconnect layers identicalto a region of the FPGA; and input/output pads matching a subset of theinput/output pads of the FPGA; wherein, a design that is mapped to saidregion of the FPGA device using said subset of input/output pads by auser programmable means can be identically mapped to the MPGA by ahard-wire circuit. Such a gate array further comprises a maskprogrammable metal-circuit in lieu of a user programmable configurationcircuit of the FPGA; and a logic output to input/output pad connectionin lieu of a logic output to a register at the boundary of said regionto an input/output pad connection of the FPGA.

Implementations of the above aspects may include one or more of thefollowing. The prototype FPGA product is user re-programmable with easybit-stream compatible turnkey design-conversion to one or moreproduction MPGAs. The selected production MPGA has the low ASIC coststructure while the prototype FPGA has the re-programmability. Theinitial FPGA product is pre-designed with the capability to port designsto a varying number of smaller MPGAs. The FPGA has a core regioncomprising programmable circuits and an input/output (I/O) pad region.The I/O region may be in the perimeter of the die, surrounding the core.The I/O region may be on two sides of the core region. The FPGA corecomprises a plurality of smaller regions: a first region, and a secondregion larger than the first region. A plurality of MPGAs isconstructed; each MPGA core having an exact circuit layout of a saidregion within the FPGA core. Each MPGA core has a set of input/outputpads surrounding the core, or on some sides of the core similar to theFPGA. The I/O pads in the MPGA are a subset of I/O pads of the FPGA.Logic blocks at core edges and I/O pad coupling are similarlyconstructed in the FPGA and MPGA. Logic blocks at the region boundary ofthe FPGA are not adjacent to the I/O pads, whereas in the MPGA the logicblocks are adjacent to I/O pads. A software tool and placement ofregisters at region boundaries is used to account for signal timingvariation. For each MPGA, the subset of I/O pads is pre-assigned in theFPGA. Within the FPGA, the user has the option of selecting one ofplurality of these regions available to place and route designs,including the entire FPGA. Each region offers a certain gate density oflogic, user-memory and input/output pad connections to the user. Thusthe user is able to place and route designs in significantly smallerportions of the FPGA, then map those designs into a matching MPGA oflower cost. As the elected region within the FPGA increases, so does theuser memory, and the I/O pads assigned to that region. Each regionwithin the FPGA may comprise one or more boundaries. Each boundary maycomprise one or more registers. Some I/O pads may be directly coupled tologic blocks in the FPGA and in the MPGA. Within a region boundary ofFPGA, logic outputs do not directly couple to I/O pads. Such logicoutputs are made to couple to a said register at the boundary. Theseregisters may be part of programmable logic blocks of the FPGA, orspecial registers placed to tie a logic output that has to couple to anI/O pad not adjacent to the region boundary. A software tool mayidentify a set of registers at the boundary account for I/O connections.Thus a logic output within the FPGA at the region boundary is firstrouted to a register at the boundary by the software tool and then to anI/O structure. The timing is pre-characterized for such a connection inthe FPGA. In the corresponding MPGA no such register is provided, andthe logic output is directly coupled to the adjacent I/O. For the MPGA,the timing without a register is also pre-characterized. Thus when aFPGA prototype design is converted to the MPGA, the I/O timing isadjusted by the software tool.

Advantages of the IC may include one or more of the following. A seriesproduct families can be provided with a modularized programmable elementin an FPGA version followed by a turnkey custom ASIC with the same basedie with 1-2 custom masks. The vertically integrated programmable moduledoes not consume valuable silicon real estate of a base die.Furthermore, the design and layout of these product families adhere toremovable module concept: ensuring the functionality and timing of theproduct in its FPGA and ASIC canonicals. These IC products can replaceexisting PLD and FPGA products and compete with existing Gate Arrays andASIC's in cost and performance. Such products offer a more reliable andlower cost ASIC design conversion from the initial PLD and FPGA.

An easy turnkey customization of an ASIC from an original smaller PLD orFPGA would greatly enhance time to market, performance, low cost andbetter reliability.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows a cross sectional view of a first embodiment of anintegrated circuit.

FIG. 2 shows a cross sectional view of a second embodiment of anintegrated circuit.

FIG. 3 shows a cross sectional view of a third embodiment of anintegrated circuit.

FIG. 4 shows a cross sectional view of a fourth embodiment of anintegrated circuit.

FIG. 5 shows an exemplary AND-OR PLD Architecture.

FIG. 6 shows an exemplary AND-OR array gate realization of PLD.

FIG. 7 shows one EEPROM implementation of a P-Term logic array.

FIG. 8 shows P-term configuration for SRAM/hard-wired PLD architecture.

FIG. 9 shows an exemplary pass-gate logic.

FIG. 10 shows an exemplary 4-Input logic MUX.

FIG. 11 shows an exemplary 2-Input Truth Table.

FIG. 12 shows a logic tree implementation of a 4-Input Truth Table.

FIG. 13 shows an exemplary 6T SRAM.

FIG. 14 shows pass gate transistor logic controlled by SRAM.

FIG. 15 shows one embodiment of a 5×6 switch matrix.

FIG. 16 shows pass gate controlled by Vcc (power) or Vss (ground)

FIG. 17 shows the 5×6 switch matrix

FIGS. 18A, 18B, 18C, 18D show a first embodiment of a prototype FPGAthat comprises three regions, each region facilitating a different MPGAconversion for production.

FIGS. 19A, 19B, 19C, 19D show a second embodiment of a prototype FPGAthat comprises three regions, each region facilitating a different MPGAconversion for production.

DESCRIPTION

In the following detailed description of the invention, reference ismade to the accompanying drawings which form a part hereof, and in whichis shown, by way of illustration, specific embodiments in which theinvention may be practiced. These embodiments are described insufficient detail to enable those skilled in the art to practice theinvention. Other embodiments may be utilized and structural, logical,and electrical changes may be made without departing from the scope ofthe present invention.

The terms wafer and substrate used in the following description includeany structure having an exposed surface with which to form theintegrated circuit (IC) structure of the invention. The term substrateis understood to include semiconductor wafers. The term substrate isalso used to refer to semiconductor structures during processing, andmay include other layers that have been fabricated thereupon. Both waferand substrate include doped and undoped semiconductors, epitaxialsemiconductor layers supported by a base semiconductor or insulator, SOImaterial as well as other semiconductor structures well known to oneskilled in the art. The term conductor is understood to includesemiconductors, and the term insulator is defined to include anymaterial that is less electrically conductive than the materialsreferred to as conductors. The following detailed description is,therefore, not to be taken in a limiting sense.

The term module layer includes a structure that is fabricated using aseries of predetermined process steps. The boundary of the structure isdefined by a first step, one or more intermediate steps, and a finalstep. The resulting structure is formed on a substrate. The term layoutrefers to a set of geometries arranged to define a masking layer.

The term configuration circuit includes one or more configurableelements and connections that can be programmed for controlling one ormore circuit blocks in accordance with a predetermined user-desiredfunctionality. In one embodiment, the configuration circuits include aplurality of memory circuits to store instructions to configure an FPGA.In another embodiment, the configuration circuits include a firstselectable configuration where a plurality of memory circuits is formedto store instructions to control one or more circuit blocks. Theconfiguration circuits include a second selectable configuration with apredetermined conductive pattern formed in lieu of the memory circuit tocontrol substantially the same circuit blocks. The memory circuitincludes elements such as diode, transistor, resistor, capacitor, metallink, among others. The memory circuit also includes thin film elements.In yet another embodiment, the configuration circuits include apredetermined conductive pattern, via, resistor, capacitor or othersuitable circuits formed in lieu of the memory circuit to controlsubstantially the same circuit blocks. The term “horizontal” as used inthis application is defined as a plane parallel to the conventionalplane or surface of a wafer or substrate, regardless of the orientationof the wafer or substrate. The term “vertical” refers to a directionperpendicular to the horizontal direction as defined above.Prepositions, such as “on”, “side”, “higher”, “lower”, “over” and“under” are defined with respect to the conventional plane or surfacebeing on the top surface of the wafer or substrate, regardless of theorientation of the wafer or substrate.

FIG. 1 shows a cross sectional view of a first embodiment of anintegrated circuit that can be selectably fabricated as either an FPGAor an ASIC. In this embodiment, a three-dimensional semiconductor device100 is shown. The device 100 includes a first module layer 102 having aplurality of circuit blocks 104 embedded therein. The device 100 alsoincludes a second module layer 106 formed substantially above the firstmodule layer 102. One or more configuration circuits 108 are formed tostore instructions to control a portion of the circuit blocks 104. Inthe first selectable option, circuits 108 are programmable to build FPGAproducts. In the second selectable option, circuits 108 are wireconnections to build ASIC products. In the embodiment of FIG. 1,wiring/routing circuits 112 are formed on a third layer 110 above thesecond layer 106. Circuits 112 connect to both circuits 104 and 108 tocomplete the functionality of the PLD.

FIG. 2 shows a cross sectional view of a second embodiment of anintegrated circuit that can be selectably fabricated as either an FPGAor an ASIC. In this embodiment, a three-dimensional semiconductor device120 is shown. The device 120 includes a first module layer 122 having aplurality of circuit blocks 124 embedded therein. The device 120 alsoincludes a second module layer 126 formed substantially above the firstmodule layer 122 that includes wiring and/or routing circuitry 128, anda third module layer 130 formed substantially above the second modulelayer 126 that includes configuration circuits 132. In the firstselectable option, circuits 132 are programmable to build FPGA products.In the second selectable option, circuits 132 are wire connections tobuild ASIC products. The wiring/routing circuitry 128 is electricallyconnected to the circuit blocks 124 and to configuration circuits 132 ina third module layer 130. The configuration circuits 132 storeinstructions to control a portion of the circuit blocks 124.

FIG. 3 shows a third embodiment which is substantially similar to theembodiment of FIG. 2. In the embodiment of FIG. 3, a fourth layer 140having wiring/routing circuitry 142 is position above the third layer130. The wiring/routing circuitry 142 is electrically connected to oneof the following: one or more circuit blocks 124, one or morewiring/routing circuitry 128, and one or more configuration circuits132.

FIG. 4 shows one implementation where the configuration memory elementis SRAM. First, silicon transistors 150 are deposited on a substrate. Amodule layer of removable SRAM memory cells 152 are positioned above thesilicon transistors 150, and a module layer of interconnect wiring orrouting circuit 154 is formed above the removable memory cells 152. Inthe first selectable option, SRAM cells 152 are programmable to buildFPGA products. In the second selectable option, cells 152 are replacedwith wire connections to build ASIC products. To allow this replacement,the design adheres to a hierarchical layout structure. As shown in FIG.4, the SRAM cell module is sandwiched between the single crystal devicelayers below and the metal layers above electrically connecting to both.It also provides through connections “A” for the lower device layers toupper metal layers. The SRAM module contains no switching electricalsignal routing inside the module. All such routing is in the layersabove and below. Most of the programmable element configuration signalsrun inside the module. Upper layer connections to SRAM module “C” areminimized to Power, Ground and high drive data wires. Connections “B”between SRAM module and single crystal module only contain logic levelsignals and replaced later by Vcc and Vss wires to build the ASIC. Mostof the replaceable programmable elements and its configuration wiring isin the “replaceable module” while all the devices and end ASIC wiring isoutside the “replaceable module”. In other embodiments, the replaceablemodule could exist between two metal layers or as the top most layersatisfying the same device and routing constraints.

Fabrication of the IC also follows a modularized device formation.Formation of transistors 150 and routing 154 is by utilizing a standardlogic process flow used in the ASIC fabrication. Extra processing stepsused for memory element 152 formation are inserted into the logic flowafter circuit layer 150 is constructed. A full disclosure of thevertical integration of the TFT module using extra masks and extraprocessing is in the co-pending incorporated by reference applicationsdiscussed above.

During the customization, the base die and the data in those remainingmask layers do not change making the logistics associated with chipmanufacture simple. In one embodiment, the custom wire connections canbe combined with the contact in module-1 and metal-1 in module-2processing. In another embodiment, the custom wire connections can be anextra metal-1, via-1 insertion compatible with logic processing. Removalof the SRAM module provides a low cost standard logic process for thefinal ASIC construction with the added benefit of a smaller die size.The design timing is unaffected by this migration as lateral metalrouting and silicon transistors are untouched. Software verification andthe original FPGA design methodology provide a guaranteed final ASICsolution to the user. A full disclosure of the ASIC migration from theoriginal FPGA is provided in the body of this discussion.

In FIG. 4, the third module layer is formed substantially above thefirst and second module layers, wherein interconnect and routing signalsare formed to connect the circuit modules within the first and secondmodule layers. Alternatively, the third module layer can be formedsubstantially below the first and second module layer with theinterconnect and routing signals formed to connect the circuit moduleswithin the first and second module layers. Alternatively, the third andfourth module layers positioned above and below the second module layerrespectively, wherein the third and fourth module layers provideinterconnect and routing signals to connect the circuit modules withinthe first and second module layers.

In yet another embodiment of a programmable multidimensionalsemiconductor device, a first module layer is fabricated having aplurality of circuit blocks formed on a first plane. The programmablemulti-dimensional semiconductor device also includes a second modulelayer formed on a second plane. A plurality of configuration circuits isthen formed to store instructions to control a portion of the circuitmodules.

In another embodiment, a programmable logic device includes one or moredigital circuits formed on a substrate; and a non-planar circuitelectrically coupled to the digital circuits, the non-planar circuitbeing either a memory constructed to store data to define the logicoutputs of the digital circuits to fabricate a field programmable gatearray (FPGA) or a conductive pattern constructed to define the logicoutputs of the digital circuits to fabricate an application specificintegrated circuit (ASIC), wherein the memory and the conductive patternoptions have substantially matching functionality timingcharacteristics.

The design/conversion of the FPGA to the ASIC is explained next. Thelarger and very complex FPGA designs are done with computer-aided design(CAD) tools. A design specification is converted to a logical entryformat for a Design Entry CAD tool. The abstract logic functions aredescribed using Hardware Description Language (HDL, VHDL) or SchematicDiagrams. The design entry is compiled to extract the netlist. Thisnetlist is used to synthesize the logic to be placed in the FPGA. Designcapture so far is independent of the FPGA platform. A customized Placeand Route (fitter) software tool is used to select the logic gates andto make the required connections in a chosen FPGA. The design placed androuted inside the FPGA is simulated using test vectors to verify theperformance and functionality. The optimized design database specifieshow the FPGA programmable resources are utilized to achieve the originaldesign objectives.

From the information contained in the design database, a configurationbitstream is generated by a tool commonly referred to as a bitstreamcompiler. All the logic and routing customization specific to the designis contained in this bitstream, which is a binary representation ofevery single configuration device in the FPGA. This is also referred toas a bitmap when the bitstream is mapped to the image of configurationelements. At the physical level, the defining binary data in thebitstream represent the ON/OFF states of the configurable switches thatcontrol logic blocks, IO blocks and interconnection in the FPGA.

At this point, the configuration bitstream either may be downloaded tothe logic array thereby configuring the device or the bitstream may besaved onto disk. If the FPGA contains non volatile memory elements, aprogrammer is used to program the bitmap into the device. Some nonvolatile memory (NVM) elements such as EEPROM and Flash lend to insystem programmability (ISP), allowing programming inside the designboard via JTAG instructions. SRAM based FPGA allow ISP, but need a NVMcontent outside the device to hold the bitstream.

Even though the design has been fine tuned in software for timing andfunctionality, it still needs to be verified on Silicon. This is due toinaccuracies between the timing model and silicon performance. Having apre-fabricated generic FPGA makes this verification simple and quick.The FPGA device is then programmed and tested in a system board toverify operational correctness. If the design does not work it isre-optimized to work on silicon. When the design works, it is initiallyfielded. Should the device prove popular, the FPGA can be converted intoan ASIC by hard-coding the bitstream.

First an image file is generated for all the B contacts that existbetween Module layer-2 and Module layer-1 in FIG. 4. These B contactsrepresent configuration element control of the logic blocks. There is aone to one matching between these B contacts and the bitmap generatedfor the design, as every configuration element is represented in both.We can define (1,0) in the bitstream to represent SRAM output at logic(1,0) respectively. Bitstream ones represent B contacts at Vcc, whilebitstream zeros represent B contacts at Vss. The bitstream can beautomatically mapped to contact B file to convert those to Vcc and Vsshard connections. The contacts B are in the CAD database that generatesthe physical mask for wafer processing. This technique provides an errorfree software conversion of the bitstream to a had-wire mask. Byappropriate pre-allocation of Vcc and Vss resources above the Bcontacts, one could conceivably generate the ASIC with only one custommask, a considerable savings in expensive mask costs. All the C contactsin the hard mask are simply omitted as no configuration elements exist,while all the A contacts are retained.

The conversion does not result in a new placement and routingconfiguration that is different from the previous FPGA design. Theconversion does not result in a change to the logic gates in modulelayer-1 or the lateral wire routing in module layer-3. The verticalcontact height change is negligible in the gate and wire delaycomponents of logic propagation. Logic gate timing is not affected bycontrol options between SRAM output or Vcc/Vss. The timing is maintainedidentical in this FPGA to ASIC conversion. Furthermore, this conversioncan be made by the FPGA supplier, with no engineering overhead, savingvaluable design resources at both end user and manufacturing sites. Thefinal hard mask ASIC has no soft errors (no SRAM bits to flip), betterreliability as fewer processing steps and fewer hard wires (oneconnection to replace 6-transistors) are used, and provide a secureenvironment against “bitstream piracy”—a technique of stealing designsby extracting the bitstream from FPGAs.

Next, details of the circuit blocks 104, the configuration circuit 108,and the wiring and/or routing circuit 112 in FIG. 1 are detailed.

A variety of digital or analog circuits can be used in circuit blocks104. These circuit blocks include programmable logic blocks to allowuser customization of logic. In one embodiment, programmable logicblocks are provided to respond to input data signals. The programmablelogic blocks develop corresponding complete or partial output logicsignals. Registers are used to store the output logic signals and eitheroutputting them to output terminals or returning them as inputs toadditional programmable logic blocks. The registers themselves can beprogrammable, allowing those to be configured such as T flip-flops, JKflip-flops, or any other register. The logic blocks may contain noregisters, or the registers may be programmed to be by-passed tofacilitate combinational logic implementation. The programmable logicblock can be selected from one of a pass gate logic, a multiplexerlogic, a truth table logic, or an AND/OR logic. FIG. 5 shows anexemplary AND-OR PLD Architecture. AND and OR arrays 202 and 204 containuser configurable programmable elements. FIG. 6 shows an exemplaryAND-OR array gate realization of a three input, four P-term, four outputPLD. The AND and the OR array 210-212 are shown programmed to a specificpattern.

In yet other embodiments, the circuit block 104 contains a RAM/ROM logicblock consisting of “logic element tree” or “P-Term logic array” blocksthat perform logic functions.

FIG. 7 shows one such NAND EEPROM implementation of a P-Term in NAND-NORlogic array, while FIG. 8 shows the same P-term configuration for eitherSRAM, or hardwired PLD architectures. FIG. 7 shows two mirrored outputsP1 and P2. For output P1, an AND gate 232 receives signals from passtransistors 222, 224, 228 and 230. The pass transistor 222 is controlledby block 220 shown in the dashed circle, while the pass transistor 228is controlled by block 226 shown inside the dashed circle. Similarly,the upper half of FIG. 8 includes an AND gate 252 that receives inputsfrom pass transistors 242, 244, 248 and 250, respectively.

FIG. 9 shows an exemplary pass-gate logic 260 connecting one input toone output. The NMOS pass gate voltage level S0 determines an ON and OFFconnection. FIG. 10 shows an exemplary 4-Input logic MUX implementing anoutput function O where O=I0*S0+I1*S1+I2*S2+I3*S3. In the MUX, only oneof S0 270, S1 272, S2 274, S3 276 has a logic one. The MUX isconstructed by combining four NMOS pass gate logic elements 280-286shown in FIG. 9.

FIG. 11 shows an exemplary 2-input truth table logic realization of anoutput function F where,F=/A*/B*S0+/A*B*S1+A*/B*S2+A*B*S3(/A means not A).The truth table logic states are represented by S0, S1, S2 and S3. Therealization is done through six inverters collectively designated 250and eight pass transistors collectively designated 260. Logic states arestored in 4 programmable registers.

FIG. 12 shows a logic tree constructed with five 2-input truth tablelogic blocks 320-328 to perform a full four input truth table. A fourinput truth table has 16 possible logic states S0, S1, . . . , S15. Asthe number of inputs grows to N, this logic tree construction requires2^(N) logic states, and 2^((N−1)) branches in the logic tree. For largeN values, a full truth table realization is less efficient compared to apartial product term AND-OR array realization.

In another embodiment, the programmable logic block can be aprogrammable microprocessor block. The microprocessor can be selectedfrom third party IP cores such as: 8051, Z80, 68000, MIPS, ARM, andPowerPC. These microprocessor architectures include superscalar, FineGrain Multi-Threading (FGMT) and Simultaneous Multi-Threading (SMT) thatsupport Application Specific Packet Processing (ASPP) routines. Tohandle Programmable Network Interface (PNI) the processor can containhardware and software configurability. Hardware upgradeability can begreatly enhanced in microprocessors embedded in PLD's by making use ofthe available logic content of the PLD device. Programmable features caninclude varying processor speed, cache memory system and processorconfiguration, enhancing the degree of Instruction Level Parallelism(ILP), enhancing Thread level parallelism (TLP). Such enhancements allowthe user to optimize the core processor to their specific application.Cache parameters such as access latency, memory bandwidth, interleavingand partitioning are also programmable to further optimize processorperformance and minimize cache hit miss rates. Additionally, theprocessor block can be a Very Long Instruction Word (VLIW) processor tohandle multimedia applications. The processor block can include a cachecontroller to implement a large capacity cache as compared with aninternal cache.

While a PLD can be configured to do DSP functions, the programmablelogic block can also contain a digital signal processor (DSP), which isa special purpose processor designed to optimize performance for veryhigh speed digital signal processing encountered in wireless andfiber-optic networks. The DSP applications can include programmablecontent for cache partitioning, digital filters, image processing andspeech recognition blocks. These real-time DSP applications contain highinterrupt rates and intensive numeric computations best handled byhardware blocks. In addition, the applications tend to be intensive inmemory access operations, which may require the input and output oflarge quantities of data. The DSP cache memory may be configured to havea “Harvard” architecture with separate, independent program and datamemories so that the two memories may be accessed simultaneously. Thisarchitecture permits an instruction and an operand to be fetched frommemory in a single clock cycle. A modified Harvard architecture utilizesthe program memory for storing both instructions and operands to achievefull memory utilization. The program and data memories are ofteninterconnected with the core processor by separate program and databuses. When both instructions and operands (data) are stored in a singleprogram memory, conflicts may arise in fetching data with the nextinstruction. Such conflicts have been resolved in prior art for DSPs byproviding an instruction cache to store conflicting instructions forsubsequent program execution.

In yet another embodiment, programmable logic block can contain softwareprogrammability. These software functions are executed in DSP, ARM, orMIPS type inserted IP cores, or an external host CPU. Acceleratorsconnected by a configurable SRAM switching matrix enhance thecomputation power of the processors. The microprocessor has localpermanent SRAM memory to swap, read, and write data. The switch matrixis pre-designed to offer both hard-wire and programmable options in thefinal ASIC. In this situation, the circuit block 104 can be a functionalblock that performs well-defined, commonly-needed function, such asspecial D/A or A/D converter, standard bus interface, or such block thatimplements special algorithms such as MPEG decode. The specialalgorithms implemented can be hardware versions of software. Forexample, algorithms relating to digital radio or cellular telephone suchas WCDMA signal processing can be implemented by the functional block.Other functional blocks include PCI, mini-PCI, USB, UART blocks that canbe configured by specifying the SRAM logic blocks.

In yet another embodiment, the circuit block 104 can be memory such as aregister file, cache memory, static memory, or dynamic memory. Aregister file is an array of latches that operate at high speed. Thisregister length counter may be programmable by the user. A cache memoryhas a high access throughput, short access latency and a smallercapacity as compared with main memory. The cache memory may beprogrammable to partition between the different requirements of thesystem design. One such need is the division between L1 and L2 cacherequirements for networking applications. The memory can also be staticrandom access memory or (SRAM) device with an array of single port, ormulti-port addressable memory cells. Each cell includes a fourtransistor flip-flop and access transistors that are coupled toinput/output nodes of the flip-flop. Data is written to the memory cellby applying a high or low logic level to one of the input/output nodesof the flip-flop through one of the access transistors. When the logiclevel is removed from the access transistor, the flip-flop retains thislogic level at the input/output node. Data is read out from theflip-flop by turning on the access transistor. The memory can also bedynamic random access memory (DRAM). Generally, a DRAM cell consists ofone transistor and a capacitor. A word line turns on/off the transistorat the time of reading/writing data stored in the capacitor, and the bitline is a data input/output path. DRAM data is destroyed during read,and refresh circuitry is used to continually refresh the data. Due tothe low component count per bit, a high density memory device isachieved.

In another embodiment, the circuit block 104 can be an intellectualproperty (“IP”) core which is reusable for licensing from othercompanies or which is taken from the same/previous design. In core-baseddesign, individual cores may be developed and verified independently asstand-alone modules, particularly when IP core is licensed from externaldesign source. These functions are provided to the user as IP blocks asspecial hardware blocks or pre-configured programmable logic blocks. TheIP blocks connect via a programmable switching matrix to each other andother programmable logic. The hardware logic block insertion to anyposition in a logic sequence is done through the configurable logicmatrix. These hardware logic blocks offer a significant gate countreduction on high gate count frequently used logic functions, and theuser does not require generic “logic element” customization. In bothcases, the user saves simulation time, minimize logic gate count,improve performance, reduce power consumption and reduce product costwith pre-defined IP blocks. The switch matrix is replaced by hardwiresin the final ASIC.

The circuit blocks 104 can also be an array of programmable analogblocks. In one embodiment, the analog blocks include programmable PLL,DLL, ADC and DAC. In another embodiment, each block contains anoperational amplifier, multiple programmable capacitors, and switchingarrangements for connecting the capacitors in such as a way as toperform the desired function. Switched capacitor filters can also beused to achieve an accurate filter specification through a ratio ofcapacitors and an accurate control of the frequency of a sampling clock.Multiple PLL's can be programmed to run at different frequencies on thesame chip to facilitate SoC applications requiring more than one clockfrequency.

The circuit blocks 104 also contain data fetch and data write circuitryrequired to configure the configuration circuits 108. This operation maybe executed by a host CPU residing in the system, or the PLD deviceitself. During power up, these circuits initialize and read theconfiguration data from an outside source, either in serial mode or inparallel mode. The data is stored in a predefined word length locallyand written to the configurability allocation. The programmedconfiguration data is verified against the locally stored data and aprogramming error flag is generated if there is a mismatch. Thesecircuits are redundant in the conversion of the PLD to an ASIC. However,these circuits are used in both FPGA and ASIC for test purposes, and hasno cost penalty. A pin-out option has a “disable” feature to disconnectthem for the customer use in the FPGA and ASIC.

Configuration circuits 108 provide active circuit control over digitalcircuits 104. One embodiment of the configuration circuit includes anarray of memory elements. The user configuration of this memory amountsto a specific bitmap of the programmable memory in a softwarerepresentation.

Suitable memory elements include volatile or non volatile memoryelements. In non-volatile memory (NVM) based products, configurable datais held in one of metal link fuse, anti-fuse, EPROM, Flash, EEPROMmemory element, or ferro-electric elements. The first two are one timeprogrammable (OTP), while the last four can be programmed multipletimes. As EPROM's require UV light to erase data, only Flash & EEPROM'slend to in-system programmability (ISP). In volatile products, theconfigurable data storage can be SRAM cells or DRAM cells. With DRAMcells, the data requires constant refresh to prevent losses fromleakages. Additionally, one or more redundant memory cells controllingthe same circuit block can be used to enhance device yield.

The components of the memory element array can be a resistor, capacitor,transistor or a diode. In another embodiment of the configurationcircuit, a memory element can be formed using thin film deposition. Thememory element can be a thin film resistor, thin film capacitor, thinfilm transistor (TFT) or a thin film diode or a group of thin filmdevices connected to form an SRAM cell.

This discussion is mostly on SRAM elements and can easily extend toinclude all other programmable elements. In all cases, the design needsto adhere to rules that allow programmable module elimination, with nochanges to the base die, a concept not used in PLD, FPGA, Gate Array andASIC products today.

An exemplary 6T SRAM cell, shown in FIG. 13, needs no high voltagecapability, nor added process complexity. The cell of FIG. 13 has twoback-to-back inverters 350-352 whose access is controlled by passtransistors 354-356. In addition, R-load & Thin Film Transistor (TFT)load PMOS based SRAM cells can be used for PLDs and FPGAs. To achievezero stand-by power by eliminating sensing circuitry, and reduce memoryelement count for low input functions, these SRAM cells are embedded intruth table logic (also called Look-Up-Table) based architectures.

Pass gate transistor 360 logic controlled by SRAM is shown in FIG. 14.In this embodiment, the memory cell (such as the cell of FIG. 13) drivesthe pass transistor 360 to e affect an outcome. A 5×6-switch pointmatrix 370 controlled by 30-SRAM cells coupled to 30-NMOS pass gates isshown in FIG. 15. FIG. 16 shows the NMOS pass gate 360 logic controlledby the SRAM in FIG. 14 converted to hard-wire logic. A contact 362,connected to Vcc (logic 1) or Vss (logic 0) depending on the SRAM logiccontent, replace the SRAM cell. The SRAM logic mapping to hard wireconnections are automatic and done by a software program that isverifiable against the bit-map.

Similarly, FIG. 17 shows the 5×6-switch point matrix 370 hard-wired byreplacing the SRAM bits that control NMOS gates with hard-wires to Vccor Vss. In FIG. 17, the bubble may represent either SRAM or hard-wireVcc or Vss control on NMOS pass gates. In the case of Fuse or Antifusearrays, contact or no contact between the two metal lines in FIG. 15directly replaces the programmable element and there is no NMOSpass-gate needed.

The P-Term logic builds the core of PLD's and complex PLD's (CPLD's)that use AND-OR blocks 202-204 (or equivalent NAND-NOR type logicfunctions) as shown in the block diagram of FIG. 5 and one expansion isshown in FIG. 6 with and gates 210 and or gates 212. Gate implementationof two inputs (I1, I2) and two P-terms (P1, P2) NAND function can besingle poly EEPROM bits as shown in FIG. 10. The dotted circle containsthe charge trapping floating gate, the programming select transistor,tunneling diode, a control gate capacitor and programming access nodes.The SRAM cell replaces that entire circle in this invention as detailednext. The SRAM NAND-NOR array (also AND-OR array) replacement has notbeen realized in prior art as SRAM cells require Nwell & Pwell regionsthat consume large silicon area to prevent latch-up. The SRAM in TFT donot have well related constraints as NMOS and PMOS bodies are isolatedfrom each other. Keeping the two pass gates in silicon layers and movingSRAM to TFT layers allow P-Term logic implementation with SRAM cells andsubsequent replacement with hard-wires. In TFT SRAM conversion to finalASIC, the bubble on NMOS gate becomes a hard-wire connection to Vcc orVss.

The length of input and output wires, and the drive on NMOS pass gatesand logic gate delays determine the overall PLD delay timing,independent of the SRAM cell parameters. By moving SRAM cell to TFTupper layers, the chip X, Y dimensions are reduced over 20% to 50%compared to traditional SRAM FPGA's, providing a faster logic evaluationtime. In addition, removal of SRAM cell later does not alter lateralwire length, wire loading and NMOS pass gate characteristic. Thevertical dimension change in eliminating the memory module is negligiblecompared to the lateral dimension of the ASIC, and has no impact ontiming. This allows maintaining identical timing between the FPGA andASIC implementations with and without the SRAM cells. The final ASICwith smaller die size and no SRAM elements have superior reliability,similar to an ASIC, leading to lower board level burn-in and fieldfailures compared to PLD's and FPGA's in use today.

Next, the wiring and/or routing circuit 112 is discussed. The wiringand/or routing circuit connects each logic block to each other logicblock. The wiring/routing circuit allows a high degree of routingflexibility per silicon area consumed and uniformly fast propagation ofsignals, including high-fanout signals, throughout the device. Thewiring module may contain one or many levels of metal interconnects.

One embodiment of a switch matrix is a 6×5 programmable switch-matrixwith 30 SRAM bits (or 30 Anti-fuses, or 30 fuses), shown in FIG. 15. Thebox in FIG. 14 contains the SRAM cell shown inside dotted box of FIG.14, where the pass gate makes the connection between the two wires, andthe SRAM bit holds the configuration data. In this configuration, thewire connection in circuit 112 occurs via a pass transistor located incircuit 104 controlled by an SRAM cell in circuit 108. During power-up,a permanent non-volatile memory block located in the system, loads thecorrect configuration data into SRAM cells. In Fuse or Anti-fuseapplications, the box simply represents the programmable element incircuit 108 between the two wires in circuit 112. During the ASICconversion this link is replaced with an open or short between thewires.

Another embodiment provides short interconnect segments that could bejoined to each other and to input and output terminals of the logicblocks at programmable interconnection points. In another embodiment,direct connections to adjacent logic blocks can be used to increasespeed. For global signals that traverse long distances, longer lines areused. Segmented interconnect structures with routing lines of variedlengths can be used. In yet other embodiments, a hierarchicalinterconnect structure provides lines of short lengths connectable atboundaries to lines of longer lengths extending between the boundaries,and larger boundaries with lines of even longer length extending betweenthose boundaries. The routing circuit can connect adjacent logic blocksin two different hierarchical blocks differently than adjacent logicblocks in the same hierarchical block. Alternatively, a tile-basedinterconnect structure can be used where lines of varying lengths inwhich each tile in a rectangular array may be identical to each othertile. In yet another implementation, the interconnect lines can beseparated from the logic block inputs by way of a routing matrix, whichgives each interconnect line more flexible access to the logic blockinputs. In another embodiment, the interconnect routing is driven byprogrammable buffers. Long wire lengths can be sub-divided into smallerlength segments with smaller buffers to achieve a net reduction in theoverall wire delay, and to obtain predictable timing in the logicrouting of the PLD.

FIG. 18A shows a first embodiment of an FPGA constructed as a regular 2DFPGA or a modular 3D FPGA. It may have configuration circuits in thesame module layers as the transistors as in conventional FPGAs. It mayhave configuration circuits in a second module layer positioned above afirst module layer that comprises logic circuits as presented in FIG. 1thru FIG. 4. The FPGA has a core region 1801. The core region comprisesprogrammable logic blocks and programmable interconnects. It furthercomprises user memory such as single-port or dual-port memory. Itfurther comprises IP blocks such as microprocessor cores, DSP cores,analog cores and other circuits typically found in ICs. It furthercomprises registers, storage devices, clocks, PLLs, DLLs and controlcircuits. The core region 1801 interfaces with input/output pad regions1811. These pad structures may be arranged around the perimeter as shownin FIG. 18A. In that, I/O structures 1811 _(A1)-1811 _(G1) are leftperimeter structures, 1811 _(A2)-1811 _(G2) are bottom perimeterstructures, 1811 _(A3)-1811 _(G3) are right perimeter structures, and1811 _(A4)-1811 _(G4) are top perimeter structures. These pad structuresmay be arranged in any other method that is found in ICs, such as twosides of the core or distributed in an array through the core.Configuration circuits provide access for a user to program thefunctionality and routing of the FPGA to achieve a desirablefunctionality and performance. Configuration circuits further provideprogrammable interface of I/O pads to inputs of logic blocks and outputsof logic blocks in the FPGA core.

The FPGA in FIG. 18A further comprises smaller regions within the coresuch as 1802 and 1803. Region 1802 comprises the entire area inside theshaded region including region 1803. Therefore the resource content ofregion 1803 is the least, 1802 is greater than in 1803, and 1801 has themost. Each region comprises a subset of resources found in the coreregion 1801. Thus a smaller design that requires fewer resources may beplaced inside region 1802, or even 1803. A software tool is able todetermine the resource content, and choose an appropriate region toplace and route the design. The region 1802, which is smaller thanregion 1801, interfaces with a subset of I/O structures 1811; the subsetI/O structures also labeled 1811 in FIG. 18A. For region 1802, I/Ostructures 1811 _(B1)-1811 _(F1) are left perimeter structures, 1811_(B2)-1811 _(F2) are bottom perimeter structures, 1811 _(B3)-1811 _(F3)are right perimeter structures, and 1811 _(B4)-1811 _(F4) are topperimeter structures. Power and ground pad structures are arranged insuch a way, they are common to all regions. A pad structure is assumedto include buffer circuits, bond pad structures, ESD structures,registers, control circuits and other circuits found in ICs. In FIG.18A, unlike for region 1801 wherein the I/O structures were adjacent tothe perimeter of the region, for region 1802, the IO structures aredistanced by circuits contained in region 1801 from the perimeter of1802. Registers 1821 are provided in the FPGA hardware such that asoftware tool is able to automatically recognize the region boundariesnot adjacent to I/O structures; insert a register and couple eitherlogic input or logic output to the register output or input respectivelyfirst; then couple the register input or output to corresponding I/Ostructure as shown. Register 1821 _(B2) couples to I/O structure 1811_(B2). Similarly, the region 1803, which is smaller than region 1802,interfaces with a subset of I/O structures 1811; the subset I/Ostructures also labeled 1811 in FIG. 18A. For region 1803, I/Ostructures 1811 _(C1)-1811 _(E1) are left perimeter structures, 1811_(C2)-1811 _(E2) are bottom perimeter structures, 1811 _(C3)-1811 _(E3)are right perimeter structures, and 1811 _(C4)-1811 _(E4) are topperimeter structures. Power and ground pad structures are arranged insuch a way, they are common to all regions. For region 1803, the 10structures are distanced by circuits contained in region 1801 and in1802 from the perimeter of 1803. Registers 1831 are provided in the FPGAhardware such that a software tool is able to automatically recognizethe region boundaries not adjacent to I/O structures; insert a registerand couple either logic input or logic output to the register output orinput respectively first; then couple the register input or output tocorresponding I/O structure as shown. Register 1831 _(C2) couples to I/Ostructure 1811 _(C2). It is understood that the FPGA in FIG. 18Acomprises more than the few pads shown for illustrative purposes, andregion 1803 may comprise hundreds of I/O structures.

FIGS. 18B, 18C and 18D show three MPGA devices constructed with theidentical resources found in regions 1801, 1802 and 1803 respectively. Afirst module layer comprising transistors of region 1802 issubstantially identically duplicated in the core region of FIG. 18C. Asecond module layer comprising a plurality of interconnects, positionedabove the first module layer is also substantially identicallyduplicated in FIG. 18C. The subset of I/O regions common to region 1802in FIG. 18A is also duplicated in FIG. 18C. In one embodiment, registers1821 are specially placed in FIG. 18A, and those are not duplicated inFIG. 18C; instead logic input or output is directly coupled to thecorresponding I/O structure. The software tool is able to identify thetiming difference in the case of having a register in the FPGA to havingno-register in the MPGA and use the appropriate delay numbers tocalculate signal delays in the MPGA. As seen to one of ordinary skill,when the transistor layouts and metal interconnects layouts aresubstantially identical between regions 1802 in FIG. 18A, and region1802 in FIG. 18C; the logic placement is identical and logical netconnects is identical and the timing delays are also identical withinthe region 1802 in both devices. Only input/output delays are different,but the difference is pre-characterized and known such that the softwaretool is able to provide an accurate design conversion from the FPGA tothe cheaper and economical smaller MPGA. One of ordinary skill mayappreciate that a design placed and routed in the region 1803 withinFPGA in FIG. 18A, can be identically placed and routed in MPGA shown inFIG. 18D; and a design placed and routed in the region 1801 within FPGAin FIG. 18A, can be identically placed and routed in MPGA shown in FIG.18B. It can also be seen the subset of I/O pad structures for the region1803 in FIG. 18A is matched to I/O structures in MPGA of FIG. 18Dwithout the need to duplicate registers 1831 of FIG. 18A in the MPGA ofFIG. 18D.

The arrangement of regions 1801-1803 is not limited to concentricregions, or to only two regions. It is conceivable that many regions mayexist within the MPGA, each region uniquely mapping to an MPGA of equalresources and I/O density. A second embodiment of an FPGA is shown inFIG. 19A, which further provides the ability to port identically mappeddesigns to MPGAs shown in FIGS. 19B, 19C and 19D. The methodology to mapdesigns is identical to that described for FIG. 18, and not repeated.The difference between FIG. 18A and FIG. 19A is in the manner in whichregions 1901, 1902 and 1903 are defined. All three regions now containtwo edges of the die, thus sharing common pads 1911 _(A1)-1911 _(C1) and1911 _(A4)-1911 _(C4). These I/O structures do not require specialregisters to interface with circuit blocks within regions 1901-1903regardless of the region chosen for the placement. However, regions 1902and 1903 comprise at least two region boundaries that do not coincidewith the I/O boundary. Such regional boundaries are provided withregisters (registers 1921 for region 1902, and registers 1931 for region1903) similar to that in FIG. 18A for the software tool to pick whencoupling to I/O structures 1911 _(A2)-1911 _(C2) and 1911 _(A3)-1911_(C3) is required.

An integrated circuit design platform, comprising: a field programmablegate array (FPGA) prototype device in FIG. 18A comprised of: a circuitlayout (in region 1801) comprising a plurality of field programmablelogic blocks and a plurality of layers of field programmableinterconnects; and a set of input/output pad structures 1811; and afirst region 1802 within the circuit layout, said region havingregisters 1821 at one or more boundaries of the region, a said registercapable of coupling to a said input/output pad structure 1811; and afirst metal programmable gate array (first MPGA FIG. 18C) productiondevice comprised of: an substantially identical layout of programmablelogic blocks in region 1902 as in the first region 1802 of the FPGA FIG.18A; and a substantially identical layout of one or more layers ofprogrammable interconnects as in the first region 1802 of the FPGA;wherein, a design mapped into the first region 1802 of the FPGA FIG. 18Ais identically mapped to the first MPGA of FIG. 19C.

The design platform, wherein the FPGA in FIG. 18A comprises aconfiguration circuit to field program the programmable logic blocks andprogrammable interconnects; and the logic blocks are formed on a firstmodule layer and the configuration circuit is formed on a second modulelayer positioned substantially above the first module layer. Thus whenthe configuration circuits are converted from user programmable circuitsto mask-programmable circuits in the MPGA, the underlying logicplacement and the interconnects are substantially kept identical betweenthe two devices, enabling a very easy and simple design conversion fromthe expensive FPGA to cheaper and better MPGA.

An integrated circuit design platform, comprising: a prototype fieldprogrammable (FPGA) device in FIG. 19A comprising a layout of electroniccircuits (in region 1901) and input/output pads 1911; and a productionmask programmable (MPGA) device in FIG. 19C comprising: a layout ofelectronic circuits (in region 1902) substantially identical to a region1802 within the prototype FPGA in FIG. 19A; and a subset of input/outputpads 1911 as within the prototype FPGA 1811; wherein, a design placedand routed within the region 1802 of the prototype FPGA using the subsetof input/output pads 1811 as in the production MPGA 1911 is identicallyplaced and routed in the production MPGA in FIG. 19C.

A smaller mask programmable gate array (MPGA) device in FIG. 19D derivedfrom a larger field programmable gate array (FPGA) device in FIG. 19A,comprising: a layout of transistors and a plurality of interconnectlayers (in region 1903 of FIG. 19D) substantially identical to a region(1903 in FIG. 19A) of the FPGA; and input/output pads (1911 in FIG. 19D)matching a subset of the input/output pads of the FPGA (1911 in FIG.19A); wherein, a design that is mapped to said region of the FPGA (1901in FIG. 19A) device using said subset of input/output pads (1911 in FIG.19A) by a user programmable means can be identically mapped to the MPGA(in FIG. 19D) by a hard-wire circuit.

A method of mapping a design to a smaller region of an FPGA (1802 inFIG. 18A), comprising: inserting a register 1821 at a boundary of asmaller region 1802 of the FPGA during logic placement; and coupling alogic block (within region 1802) to said register 1821, and couplingsaid register 1821 to an input/output pad 1811 located at the edge ofthe FPGA die. The method further comprised of identically mapping thesame design to an MPGA (in FIG. 18C) comprising substantially identicaltransistor layout of said region 1802 of the FPGA, comprising: couplingsaid logic block to an input/output pad of the MPGA die (1811 in FIG.18C) without the intermediate register.

In the conversion platform comprising the FPGA in FIG. 18A and MPGA inFIG. 18C, said region 1802 of the FPGA and said MPGA further comprisesan exact layout of one or more pass-gate devices to couple a saidprogrammable logic block to a said interconnect wire, wherein: in theFPGA, the pass-gate device couples the logic block to the interconnectwire, said pass-gate device controlled by an output of a RAM bit, saidRAM bit comprising: a logic one to couple the logic block to theinterconnect wire; and a logic zero to decouple the logic block from theinterconnect wire; and in the MPGA, the pass-gate device couples thelogic block to the interconnect wire, said pass-gate device controlledby an output of a ROM bit, said ROM bit comprising: a metal connectionto power bus to couple the logic block to the interconnect wire; and ametal connection to ground bus to decouple the logic block from theinterconnect wire. When the RAM bit in a 3D configuration within theFPGA is replaced by a hard-wired ROM bit in the MPGA, the circuitbehavior and interconnect pattern is maintained between the two devices.

In the conversion platform comprising the FPGA in FIG. 18A and MPGA inFIG. 18C, said region 1802 of the FPGA and said MPGA further comprisesan exact layout of one or more pass-gate devices to couple said one ormore logic blocks to a said interconnect wire, wherein: in the FPGA, apass-gate device couples a logic block to an interconnect wire, saidpass-gate device controlled by an output of a RAM bit, said RAM bitcomprising: a logic one to couple the logic block to the interconnectwire; and a logic zero to decouple the logic block from the interconnectwire; and in the MPGA, said pass-gate device is decoupled from saidinterconnect wire when the RAM bit comprises a logic zero; and in theMPGA, said pass-gate device is replaced by a metal jumper when the RAMbit comprises a logic one. By this conversion, an interconnect wire inthe FPGA comprises a high capacitance due to the pass-gate devicejunctions coupled to the interconnect wire, and wherein saidinterconnect wire in the MPGA comprises less capacitance due to thepass-gate junctions decoupled from the interconnect wire; and aninterconnect wire coupled to a logic block encounters a high resistancefrom the on pass-gate device in the FPGA, and wherein said interconnectwire coupled to the logic block in the MPGA encounters less resistancedue to the metal-jumper. It is easily appreciated that in an FPGA anygiven wire segment is coupled to a plurality of logic blocks, bothinputs and outputs of logic blocks, which makes FPGA slower and consumemore power. In the conversion to an MPGA, much of the unwanted logicblocks can be decoupled from the wire segment, thereby making the MPGAfaster or consume less power. It can be further appreciated that theposition of the wire segment has not altered between the FPGA and theMPGA, thus the wire delays are easily pre-characterized and theconversion is made bit-stream compatible.

Clearly the new modular concept described in this andenclosed-by-reference applications disclose devices where theconfiguration circuit module layer is positioned above a circuit modulelayer. Thus between the FPGA (that comprises user RAM configurationmodule layer) and the derivative MPGA (that comprises a hard-wireconfiguration circuit) the circuit transistors in first module layercomprises an identical layout. The interconnect wires between the twodevices also comprises a nearly identical layout: in a first embodimentwhen RAM bit is replaced by a ROM bit, the interconnect is identical;and in a second embodiment when nodes are disconnected from wiresegments and pass-gates are replaced by metal jumpers, the interconnectis nearly identical. In both cases, the interconnect segments have notpositionally changed.

Next, a brief description of the manufacturing process is discussed.During manufacturing, one or more digital circuits can be formed on asubstrate. Next, the process selectively fabricates either a memorycircuit or a conductive pattern substantially above the digital circuitsto control portion of digital circuits. Finally, the process fabricatesan interconnect and routing layer substantially above the digitalcircuits and memory circuits to connect digital circuits and one of thememory circuit or the conductive pattern.

The process can be modified to fabricate a generic field programmablegate array (FPGA) with the constructed memory circuit or an applicationspecific integrated circuit (ASIC) with the constructed conductivepattern. Multiple ASICs can be fabricated with different variations ofconductive patterns. The memory circuit and the conductive pattern haveone or more substantially matching circuit characteristics. In thiscase, timing characteristics substantially unchanged by the circuitcontrol option. The process thus fabricates a programmable logic deviceby constructing digital circuits on a substrate; and constructing anon-planar circuit on the substrate after constructing the digitalcircuits, the non-planar circuit being either a memory deposited tostore data to configure the digital circuits to form a fieldprogrammable gate array (FPGA) or a conductive pattern deposited tohard-wire the digital circuits to form an application specificintegrated circuit (ASIC), wherein the deposited memory and theconductive pattern have substantially matching timing characteristics.In another embodiment, the hard-wire ASIC option may be incorporatedinto the digital circuit layer 100. In another embodiment, the hard-wireASIC option is incorporated into the routing layer 110.

Although an illustrative embodiment of the present invention, andvarious modifications thereof, have been described in detail herein withreference to the accompanying drawings, it is to be understood that theinvention is not limited to this precise embodiment and the describedmodifications, and that various changes and further modifications may beeffected therein by one skilled in the art without departing from thescope or spirit of the invention as defined in the appended claims.

What is claimed is:
 1. An integrated circuit design platform,comprising: a field programmable gate array (FPGA) prototype devicecomprised of: a circuits layout comprising a plurality of fieldprogrammable logic blocks and a plurality of layers of fieldprogrammable interconnects; and a set of input/output pad structures;and a first region within the circuits layout, said region havingregisters at one or more boundaries of the region, said registerscapable of coupling to said input/output pad structures; and a metalprogrammable gate array (MPGA) production device fabricated separatelyfrom the FPGA prototype device, the MPGA production device comprised of:a substantially identical circuit layout as in the first region of theFPGA; and a substantially identical layout of one or more layers ofprogrammable interconnects as in the first region of the FPGA; wherein,a design mapped to the first region of the FPGA is identically mapped tothe MPGA.
 2. The platform of claim 1, wherein the FPGA comprises aconfiguration circuit to field program the programmable logic blocks andprogrammable interconnects.
 3. The platform of claim 2, wherein in theFPGA, the transistors for logic circuits are formed on a first modulelayer and the configuration circuit is formed on a second module layerpositioned substantially above or below the first module layer.
 4. Theplatform of claim 2, wherein the configuration circuit comprises one ormore of: resistor, capacitor, SRAM cell, DRAM cell, Flash cell, EPROMcell, EEPROM cell, Carbon nano-tube, resistance modulating element,ferro-electric element, electro-chemical cell, electro-mechanicalelement, optical element and electro-magnetic cell.
 5. The platform ofclaim 1, wherein the MPGA comprises a customized metal circuit to maskprogram the programmable logic blocks and programmable interconnects. 6.The platform of claim 5, wherein the customized metal circuit comprisesone or more of: wire connection, wire disconnect, via connection,resistor element, shorted capacitor, capacitor, power bus connection,ground bus connection, transistor short, logic zero output connection,and logic one output connection.
 7. The platform of claim 1, whereinsaid first region of the FPGA and said first MPGA further comprisescomprise a substantially identical layout of one or more pass-gatedevices to couple said programmable logic block to said an interconnectwire, wherein: in the FPGA, the pass-gate device couples the logic blockto the interconnect wire, said pass-gate device controlled by an outputof a RAM bit, said RAM bit comprising: a logic one to couple the logicblock to the interconnect wire; and a logic zero to decouple the logicblock from the interconnect wire; and in the MPGA, the pass-gate devicecouples the logic block to the interconnect wire, said pass-gate devicecontrolled by an output of a ROM bit, said ROM bit comprising: a metalconnection to a power bus to couple the logic block to the interconnectwire; and a metal connection to a ground bus to decouple the logic blockfrom the interconnect wire.
 8. The platform of claim 1, wherein saidfirst region of the FPGA and said first MPGA further comprises comprisea substantially identical layout of one or more pass-gate devices tocouple said one or more logic blocks to said an interconnect wire,wherein: in the FPGA, a pass-gate device couples a logic block to aninterconnect wire, said pass-gate device controlled by an output of aRAM bit, said RAM bit comprising: a logic one to couple the logic blockto the interconnect wire; and a logic zero to decouple the logic blockfrom the interconnect wire; and in the MPGA, said pass-gate device isdecoupled from said interconnect wire when the RAM bit comprises a logiczero; wherein an interconnect wire in the FPGA comprises a highcapacitance due to the pass-gate device junctions coupled to theinterconnect wire, and wherein said interconnect wire in the MPGAcomprises less capacitance due to the pass-gate junctions decoupled fromthe interconnect wire.
 9. The platform of claim 1, wherein said firstregion of the FPGA and said first MPGA further comprises comprise asubstantially identical layout of one or more pass-gate devices tocouple said one or more logic blocks to a said an interconnect wire,wherein: in the FPGA, a pass-gate device couples a logic block to ansaid interconnect wire, said pass-gate device controlled by an output ofa RAM bit, said RAM bit comprising: a logic one to couple the logicblock to the interconnect wire; and a logic zero to decouple the logicblock from the interconnect wire; and in the MPGA, said pass-gate deviceis replaced by a metal jumper when the RAM bit comprises a logic one;wherein an interconnect wire coupled to a logic block encounters a highresistance from the on pass-gate device in the FPGA, and wherein saidinterconnect wire coupled to the logic block in the MPGA encounters lessresistance due to the metal-jumper.
 10. The platform of claim 1, furthercomprising: said field programmable gate array (FPGA) prototype devicecomprised of: a second region within the circuits layout, said secondregion having registers at one or more boundaries of the region, saidregister registers capable of coupling to said input/output padstructure; and a second metal programmable gate array (second MPGA)production device comprised of: a substantially identical circuitslayout as in the second region of the FPGA; and a substantiallyidentical layout of one or more layers of programmable interconnects asin the second region of the FPGA; wherein, a design mapped to the secondregion of the FPGA is identically mapped to the second MPGA.
 11. Anintegrated circuit design platform, comprising: a prototype fieldprogrammable (FPGA) device comprising a layout of electronic circuitsand input/output pads; and a production mask programmable (MPGA) devicefabricated separately from the FPGA prototype device, the MPGA devicecomprising: a layout of electronic circuits substantially identical to aregion within the prototype FPGA device; and a subset of input/outputpads as within the prototype FPGA device; wherein a design placed androuted within the region of the prototype FPGA device using the subsetof input/output pads as in the production MPGA device, is identicallyplaced and routed in the production MPGA device.
 12. The platform ofclaim 11, wherein the region of the FPGA and the MPGA has substantiallyidentical layouts of transistors and substantially identical layouts ofone or more layers of interconnects.
 13. The platform of claim 11,wherein the MPGA has at least one customized interconnect layer to mapfield programmable data in the prototype FPGA to mask programmable data.14. The platform of claim 11, wherein the FPGA comprises a configurationcircuit further comprising one or more of: resistor, capacitor, SRAMcell, DRAM cell, Flash cell, EPROM cell, EEPROM cell, Carbon nano-tube,resistance modulating element, ferro-electric element, electro-chemicalcell, electro-mechanical element, optical element and electromagneticcell.
 15. The platform of claim 11, wherein the MPGA comprises acustomized metal circuit further comprising one or more of: wireconnection, wire disconnect, via connection, resistor element, shortedcapacitor, capacitor, power bus connection, ground bus connection,transistor short, logic zero output connection, and logic one outputconnection.
 16. The platform of claim 11, wherein the FPGA comprises aRAM bit, and wherein the MPGA comprises a hard-wired ROM bit.
 17. Theplatform of claim 11, wherein the MPGA comprises one or more of: a metallink to couple a node to a power supply voltage; and a metal link tocouple a node to a ground supply voltage; and a metal jumper to shorttwo nodes; and a metal disconnect to isolate two nodes.
 18. A small maskprogrammable gate array (MPGA) device derived from a large fieldprogrammable gate array (FPGA) device fabricated separately from theFPGA prototype device, the MPGA device, comprising: a layout oftransistors and a plurality of interconnect layers substantiallyidentical to a smaller region of the FPGA device; and input/output padsmatching a subset of the input/output pads of the FPGA device; wherein,a design that is mapped to said small region of the FPGA device usingsaid subset of input/output pads by a user programmable means isidentically mapped to the MPGA device by a hard-wire circuit during asubsequent fabrication of the MPGA device.
 19. The device of claim 18,further comprising: a mask programmable metal-circuit in lieu of a userprogrammable configuration circuit of the FPGA; and a logic block toinput/output pad connection in lieu of a logic block to a register atthe boundary of said smaller region to an input/output pad connection ofthe FPGA.
 20. The device of claim 18, wherein: a first set ofinput/output pad pads to a first set of logic blocks within the MPGA isidentically mapped from that of the FPGA; and a second set ofinput/output pad pads to a second set of logic blocks within the MPGA ismapped from the corresponding logic blocks to registers at regionboundary to corresponding input/output pads of the FPGA.
 21. A method ofproducing a metal programmable gate array (MPGA), said methodcomprising: accessing a design for a circuits layout for a fieldprogrammable gate array (FPGA), said circuits layout in said designcomprising a plurality of field programmable logic blocks configured ina core region, said core region in said design comprising a plurality ofsub-regions that are smaller than said core region, said design for saidFPGA further comprising a first region within said circuits layout and aregister at a boundary of said first region, a plurality of layers offield programmable interconnects, and a set of input/output (I/O) padstructures; and fabricating an MPGA device based on said design, saiddesign configured so that said fabricating of said MPGA device isseparate from fabrication of an FPGA according to said design, said MPGAdevice comprising a circuit layout comprising a subset of said pluralityof said sub-regions that are in said design, said circuit layout of saidMPGA device comprising a substantially identical layout as in said firstregion of said design but excluding said register at said boundary ofsaid first region, wherein said MPGA device further comprises asubstantially identical layout of one or more of said layers ofprogrammable interconnects as in said first region of said design;wherein said first region in said design is identically mapped to saidMPGA device.
 22. The method of claim 21, wherein said design for saidFPGA comprises a plurality of input/output (I/O) pads arranged around aperimeter of said core region, wherein said MPGA device interfaces witha subset of said plurality of I/O pads that are in said design.
 23. Themethod of claim 21, wherein said design comprises power and ground padstructures that are arranged in positions that are common to all of saidsub-regions.
 24. The method of claim 21, wherein said MPGA devicefurther comprises: a first module layer comprising field programmablelogic blocks; and a second module layer adjacent to said first modulelayer and comprising routing circuitry coupled to said fieldprogrammable logic blocks of said MPGA device.
 25. The method of claim21, further comprising: identifying a timing difference between aninput/output (I/O) delay for said design and an I/O delay determined forsaid MPGA device; and compensating for said timing difference in saidMPGA device.
 26. The method of claim 21, wherein said plurality ofsub-regions comprises a first region and a second region positionedconcentrically about the perimeter of said first region.
 27. The methodof claim 21, wherein sub-regions of said plurality of sub-regions sharea first boundary and a second boundary.
 28. The method of claim 21,wherein said MPGA device further comprises a customized metal circuit tomask program programmable logic blocks and programmable interconnects insaid MPGA device.
 29. The method of claim 28, wherein said customizedmetal circuit is selected from the group consisting of: wire connection,wire disconnect, via connection, resistor element, shorted capacitor,capacitor, power bus connection, ground bus connection, transistorshort, logic zero output connection, and logic one output connection.30. The method of claim 21, wherein said MPGA device and said firstregion of said design further comprise a substantially identical layoutof one or more pass-gate devices configured to couple a fieldprogrammable logic block to an interconnect wire, wherein in said MPGAdevice, said pass-gate device is operable for coupling said logic blockto said interconnect wire, said pass-gate device is controlled by anoutput of a ROM bit, and said ROM bit comprises: a metal connection to apower bus to couple said field programmable logic block to saidinterconnect wire; and a metal connection to a ground bus to decouplesaid field programmable logic block from said interconnect wire.
 31. Themethod of claim 21, wherein said MPGA device and said first region ofsaid design further comprise a substantially identical layout of one ormore pass-gate devices configured to couple a field programmable logicblock to an interconnect wire, wherein in said MPGA device, saidpass-gate device is decoupled from said interconnect wire when a RAM bitcomprises a logic zero.